Steven Kawamoto, Sr. Marketing Manager, Custom LSI Solutions Unit, Gaku Ogura, Sr. Marketing Manager, Design Solutions Center, Richard Lee, Design Engineer, Design ...
Recently, DFT elements have begun to show up in more and more large complex SoC devices. The concept of scan no longer raises the objections of overhead to the extent it used to. Yet, customers and ...
The complexity with system-on-chip (SoC) design continues to grow, creating greater complexity of the corresponding design-for-test (DFT) logic required for manufacturing tests. Design teams are ...
What if all the DFT verification on your next big chip could be completed before tape-out? This “shift-left” of DFT verification would eliminate the need for shortcuts in verification and allow for ...
Due to its high electron mobilities at ambient temperature and peculiar electronic behaviors like the quantum hall effect, which imitates massless transportation and results in high superconductivity, ...
Recently, DFT elements have begun to show up in more and more large complex SoC devices. The concept of scan no longer raises the objections of overhead to the extent it used to. Yet, customers and ...
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