Designs with LogicBIST exhibit random pattern resistance because of the random nature of LBIST vectors, thus leading to low fault coverage. To handle this, we insert test points with the help of ...

The self-assembly of block copolymer thin films can generate dense nanoscale patterns over large areas 1,2,3,4,5,6,7,8. When directed by a sparse topographic or chemical template, the block copolymers ...

Self-assembly of block-copolymers provides a route to the fabrication of small (size, <50 nm) and dense (pitch, <100 nm) features with an accuracy that approaches even the demanding specifications for ...